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Simulation of defectoscopic X-ray television systems for non-destructive testing of semiconductor materials
(National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, 2007) Slobodian, Nina; Denbnovetsky, Stanislav
The work is devoted to increasing effectiveness of X-ray television systems for non-destructive testing on base of selecting by simulation the most profitable functioning regimes of X-ray-electrical signal converter unit for testing of the semiconductor materials. The method of selecting the most profitable X-ray apparatus regime is proposed. The simulation of radiation generation from pulse X-ray tubes is performed. For small-signal approach the end-to-end model of X-ray-electrical signal unit with X-ray vidicon by means of linear digital non-recursive filter is made. The digital non-linear model of such unit is implemented. The end-to-end model of converter with CCD-matrix is developed and applied. Good correspondence between the results obtained in the framework of proposed model and by performed experiments is achieved.